Analog-to-digital converter with embedded noise-shaped truncation, embedded noise-shaped segmentation and/or embedded excess loop delay compensation
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United States of America Patent
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Jan 16, 2018
Grant Date -
Dec 7, 2017
app pub date -
Apr 27, 2017
filing date -
Jun 3, 2016
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Abstract
An exemplary quantizer includes a multi-bit analog-to-digital converter (ADC) and a first digital-to-analog converter (DAC) feedback circuit. The multi-bit ADC has an internal DAC associated with comparison of each sampled analog input of the multi-bit ADC. The multi-bit ADC converts a currently-sampled analog input into a first digital output. A first noise-shaped truncation output is derived from the first digital output. The first DAC feedback circuit transfers a first truncation residue associated with the first noise-shaped truncation output to the internal DAC. The transferred first truncation residue is reflected in comparison of a later-sampled analog input of the multi-bit ADC via the internal DAC.
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