MEASURING DELAY LINE LINEARITY CHARACTERISTICS

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United States of America Patent

SERIAL NO

15182567

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Abstract

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A method of measuring linearity characteristics of a delay line may be provided. The method may include generating an output signal from a receiver including a delay line. The method may also include measuring linearity characteristics of the delay line based on a target performance parameter of the output signal.

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Patent Owner(s)

Patent OwnerAddress
FUJITSU LIMITED1-1 KAMIKODANAKA 4-CHOME NAKAHARA-KU KAWASAKI-SHI KANAGAWA 2118588 ?2118588

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KIBUNE, Masaya Santa Clara, US 26 342
NEDOVIC, Nikola San Jose, US 76 530
USUI, Daisuke Cupertino, US 13 43

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