MASK BLANK SUBSTRATE, MASK BLANK, AND METHODS FOR MANUFACTURING THEM, METHOD FOR MANUFACTURING TRANSFER MASK, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

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United States of America Patent

SERIAL NO

15533496

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Abstract

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The object is to provide a mask blank substrate, a mask blank, and a transfer mask which can achieve easy correction of a wavefront by a wavefront correction function of an exposure apparatus. The further object is to provide methods for manufacturing them.

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Patent Owner(s)

Patent OwnerAddress
HOYA CORPORATION6-10-1 NISHI-SHINJUKU SHINJUKU-KU SHINJUKU-KU TOKYO 160-8347

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
IKEBE, Yohei Shinjuku-ku, JP 34 160
TANABE, Masaru Shinjuku-ku, JP 44 179

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