SAMPLE MEASUREMENT SYSTEM AND METHOD OF RETRIEVING TRAY IDENTIFICATION INFORMATION

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United States of America Patent

SERIAL NO

15702798

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A sample measurement system may include: a measurement unit that measures a sample in a sample container; a transport unit that transports a rack that can hold sample containers, via the measurement unit; a collection unit that is detachably provided with a tray in which racks can be set, and that collects the rack transported from the measurement unit by the transport unit and sets the rack in the tray; a storage that stores sample identification information, rack identification information, and tray identification information in association with each other; an input part; a display part; and a controller that, in a condition in which the input part receives input of the sample identification information or the rack identification information, causes the display part to display the tray identification information stored in association with the inputted sample identification information or the inputted rack identification information.

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Patent Owner(s)

Patent OwnerAddress
SYSMEX CORPORATIONKOBE-SHI HYOGO 651-0073

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
OHMAE, Yuichiro Kobe-shi, JP 29 116
TATSUTANI, Hiroo Kobe-shi, JP 36 153

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