Operation voltage testing circuit and method
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United States of America Patent
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Jun 25, 2019
Grant Date -
Jan 4, 2018
app pub date -
Oct 31, 2016
filing date -
Jul 1, 2016
priority date (Note) -
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Abstract
An operation voltage testing circuit includes a voltage generating circuit, a current-to-voltage conversion circuit, and a processing circuit. The voltage generating circuit is configured to generate a first voltage signal according to a first current signal, such that a photoelectric conversion unit generates a second current signal corresponding to the first voltage signal. The current-to-voltage conversion circuit is configured to generate a second voltage signal corresponding to the second current signal. The processing circuit is configured to receive the second voltage signal and to selectively adjust and output the first current signal according to the second voltage signal and a threshold value, such that the voltage generating circuit selectively adjusts the first voltage signal according to the first current signal.
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