WITHIN-DIE SPECIAL OSCILLATOR FOR TRACKING SRAM MEMORY PERFORMANCE WITH GLOBAL PROCESS VARIATION, VOLTAGE AND TEMPERATURE
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United States of America Patent
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app pub date -
Jun 29, 2016
filing date -
Jun 29, 2016
priority date (Note) -
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Abstract
An apparatus includes a memory, a timing circuit configured to emulate a first operation of the memory to activate a second operation of the memory, a sensor configured to emulate a portion of the timing circuit, and a controller configured to adjust an operating parameter of the memory based on the sensor emulating the portion of the timing circuit. A method is presented. The method includes at least operating a timing circuit to emulate a first operation of the memory, activating a second operation of the memory based on the emulating the first operation of the memory, emulating, by a sensor, a portion of the timing circuit. Another apparatus is presented. The apparatus includes at least a memory, a timing circuit, and means for tracking a performance of the memory based on the timing circuit tracking a memory operation.
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