MACHINE LEARNING IN ADVERSARIAL ENVIRONMENTS

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United States of America Patent

SERIAL NO

15201224

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Abstract

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An adversarial environment classifier training system includes feature extraction circuitry to identify a number of features associated with each sample included in an initial data set that includes a plurality of samples. The system further includes sample allocation circuitry to allocate at least a portion of the samples included in the initial data set to at least a training data set; machine-learning circuitry communicably coupled to the sample allocation circuitry, the machine-learning circuitry to: identify at least one set of compromiseable features for at least a portion of the initial data set; define a classifier loss function [l(xi, yi, w)] that includes: a feature vector (xi) for each sample included in the initial data set; a label (yi) for each sample included in the initial data set; and a weight vector (w) associated with the classifier; and determine the minmax of the classifier loss function (minwmaxi l(xi, yi, w)).

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Patent Owner(s)

Patent OwnerAddress
INTEL CORPORATION2200 MISSION COLLEGE BOULEVARD SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GAI, YI Hillsboro, US 12 15
SAHITA, RAVI L Beaverton, US 121 1036
YANG, CHIH-YUAN Portland, US 55 104

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