Implementing register array (RA) repair using LBIST

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United States of America Patent

PATENT NO 10234507
APP PUB NO 20180024189A1
SERIAL NO

15214767

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Abstract

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A method and circuit for implementing register array repair using Logic Built In Self Test (LBIST), and a design structure on which the subject circuit resides are provided. Register array repair includes identifying and creating a list of any repairable Register Arrays (RAs) that effect an LBIST fail result. Next a repair solution is detected for each of the repairable Register Arrays (RAs) isolating a failing location for the detected repair solution for each array.

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Patent Owner(s)

  • INTERNATIONAL BUSINESS MACHINE CORPORATION

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Douskey, Steven M Rochester, US 63 258
Hamilton, Michael J Rochester, US 32 88
Kaufer, Amanda R Rochester, US 31 85
Senum, Phillip A Rochester, US 6 7

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