Surface Analysis Systems and Methods of Generating a Comparator Surface Reference Model of a Multi-Part Assembly Using the Same
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United States of America Patent
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Jul 27, 2016
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Jul 27, 2016
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Abstract
A surface analysis system that includes one or more processors and one or more memory modules. The surface analysis system identifies one or more visible surface segments of a first part of a first multi-part assembly that includes a second part having one or more hidden surface segments. The surface analysis system also classifies the one or more visible surface segments of the first part as comparator surfaces, determines a segment spacing distance between at least one hidden surface segment of the second part and the first part, classifies the one or more hidden surface segments of the second part positioned adjacent and unobstructed from the first part that have a segment spacing distance less than or equal to a threshold spacing distance as comparator surfaces, and generates a comparator surface reference model corresponding with the one or more comparator surfaces.
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