METHOD, APPARATUS, AND SYSTEM FOR REDUCING DOPANT CONCENTRATIONS IN CHANNEL REGIONS OF FINFET DEVICES

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United States of America Patent

APP PUB NO 20180033789A1
SERIAL NO

15224139

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Abstract

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We disclose semiconductor devices, comprising a semiconductor substrate comprising a substrate material; and a plurality of fins disposed on the substrate, each fin comprising a lower region comprising the substrate material, a dopant region disposed above the lower region and comprising at least one dopant, and a channel region disposed above the dopant region and comprising a semiconductor material, wherein the channel region comprises less than 1×1018 dopant molecules/cm3, as well as methods, apparatus, and systems for fabricating such semiconductor devices.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bentley, Steven Watervliet, US 68 660
Karve, Gauri Cohoes, US 73 204
Lim, Kwan-Yong Niskayuna, US 111 1501
Mehta, Sanjay Niskayuna, US 85 1414
Yamashita, Tenko Schenectady, US 599 4947

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