Integrated circuit automatic test system and integrated circuit automatic test method storing test data in scan chains
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United States of America Patent
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Jun 18, 2019
Grant Date -
Feb 8, 2018
app pub date -
Apr 5, 2017
filing date -
Aug 5, 2016
priority date (Note) -
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Abstract
An integrated circuit (IC) automatic test system and an IC automatic test method storing test data in scan chains are revealed. The automatic test system includes at least one scan chain, a test controller and a test decompressor connected. Each scan chain consists of a storage portion with a plurality of scan units and a scan input corrector. The storage portion is for storing test data and the scan input corrector is used to adjust test patterns to be shifted into the scan chains. The test controller is for control of test flow while the test decompressor reconstructs and decompresses the test data stored in the storage portions of the scan chains to generate test patterns for the circuit under test. Thereby the IC electrical test is performed automatically and the test cost and the test cost is reduced.
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