ANALYSIS SYSTEM
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United States of America Patent
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Issued Date -
Feb 15, 2018
app pub date -
Aug 4, 2017
filing date -
Aug 10, 2016
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Abstract
An analysis system includes detectors provided in an apparatus, first analysis devices each configured to generate processed data by performing predetermined processing on detection information from each of the detectors, and to evaluate an object to be evaluated based on the detection information from each of the detectors and on an evaluation pattern, and a second analysis device configured to update the evaluation pattern based on the processed data generated by each of the first analysis devices.
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