Crosstalk suppression in wireless testing of semiconductor devices

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 10641821
APP PUB NO 20180045775A1
SERIAL NO

15782962

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Abstract

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An integrated circuit is fabricated on a semiconductor material die and adapted to be at least partly tested wirelessly. Circuitry for setting a selected radio communication frequency to be used for the wireless test of the integrated circuit is integrated on the semiconductor material die.

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Patent Owner(s)

  • STMICROELECTRONICS S.R.L.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pagani, Alberto Nova Milanese, IT 145 1069

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