Semiconductor devices for impedance calibration including systems and methods thereof
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United States of America Patent
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Nov 20, 2018
Grant Date -
Feb 22, 2018
app pub date -
May 17, 2017
filing date -
Aug 16, 2016
priority date (Note) -
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Abstract
A semiconductor system may be provided. The semiconductor system may include a first semiconductor device, a second semiconductor device, and a third semiconductor device. The first semiconductor device outputs address signals. The first semiconductor device may receive or output data. The second semiconductor device may perform an impedance calibration operation and outputs pull-up codes and pull-down codes generated by the impedance calibration operation. The third semiconductor device may output internal data selected by the address signals as the data or store the data during a write operation or a read operation.
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