LIGHT MEASUREMENT DEVICE

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United States of America Patent

SERIAL NO

15559872

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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[Object] To obtain interference light having a stronger light intensity, and to more accurately measure a refractive index of a measured object, with a simplified configuration.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATIONMINATO-KU TOKYO

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ABE, Katsumi Tokyo, JP 151 10173
AKAGAWA, Takeshi Tokyo, JP 26 58
ALTINTAS, Ersin Tokyo, JP 25 32
ARIYAMA, Tetsuri Tokyo, JP 24 31
KUBO, Masahiro Tokyo, JP 188 1242
OHNO, Yuji Tokyo, JP 63 197
TAKOH, Kimiyasu Tokyo, JP 28 37

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