METAL ION DETECTION EQUIPMENT AND METAL ION DETECTION METHOD

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United States of America Patent

APP PUB NO 20180059017A1
SERIAL NO

15369353

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Abstract

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A metal ion detection equipment and a metal ion detection method are provided. The metal ion detection equipment includes a porous silicon resonant cavity structure, an electrochemical device and a spectrum detecting device. A sample solution permeates into the porous silicon resonant cavity structure. A to-be-detected metal ion of the sample solution in the porous silicon resonant cavity structure is reduced into a to-be-detected metal by the electrochemical device. The spectrum detecting device detects a spectral variation of a reflective light from the porous silicon resonant cavity structure.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL TSING HUA UNIVERSITYNO 101 SEC 2 KWANGFU RD HSINCHU CITY 30013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lai, Jian Ren Changhua County, TW 1 0
Tseng, Fan-Gang Taipei City, TW 73 472
Wu, Jen-Kuei New Taipei City, TW 10 3

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