System and Method for Generating System Testing Data
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United States of America Patent
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Aug 23, 2016
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Aug 23, 2016
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Abstract
A method includes providing a hierarchy of pattern definitions, wherein each pattern definition in the hierarchy of pattern definitions is associated with a parameter that is used to simulate operation of a computer system, and wherein each pattern definition in the hierarchy of pattern definitions comprises at least a value producer and a time interval, and traversing the hierarchy of pattern definitions for each parameter to select a pattern definition. The method further includes generating an event associated with the parameter in accordance with the value generator of the selected pattern definition, and transmitting the event to a system testing platform.
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