PARALLAX MINIMIZATION STITCHING METHOD AND APPARATUS USING CONTROL POINTS IN OVERLAPPING REGION

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United States of America Patent

SERIAL NO

15662616

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Abstract

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Provided is a parallax minimization stitching method and apparatus using control points in an overlapping region. A parallax minimization stitching method may include defining a plurality of control points in an overlapping region of a first image and a second image received from a plurality of cameras, performing a first geometric correction by applying a homography to the control points, defining a plurality of patches based on the control points, and performing a second geometric correction by mapping the patches.

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Patent Owner(s)

Patent OwnerAddress
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTEDAEJEON 34129

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
AHN, Sangwoo Daejeon, KR 15 60
CHO, Yong Ju Daejeon, KR 30 204
JUNG, Soon-heung Daejeon, KR 11 44
KIM, Hyun Cheol Sejong-si, KR 107 175
LEE, Hee Kyung Daejeon, KR 18 231
LEE, Injae Daejeon, KR 41 83
LIM, Seong Yong Daejeon, KR 21 146
SEO, Jeongil Daejeon, KR 56 518
SEOK, Joo Myoung Daejeon, KR 19 192
YANG, Seung Jun Daejeon, KR 17 173

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