CONDUCTION-PATH-EQUIPPED MEMBER, METHOD FOR PATTERNING CONDUCTION PATH, AND METHOD FOR MEASURING CHANGES IN MEMBER
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Mar 31, 2016
filing date -
Mar 31, 2015
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
The present invention directly forms, on part of a member to be measured, a conduction path for measuring changes in said member. The present invention thus detects changes such as stress and displacement acting on a conduction-path-equipped member 30 intended for use in a structural member or the like. Consequently, circumstances generating stress in the member can be objectively monitored.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully