Structure evaluation system, structure evaluation apparatus, and structure evaluation method

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United States of America Patent

PATENT NO 10458954
APP PUB NO 20180074023A1
SERIAL NO

15454182

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Abstract

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According to an embodiment, a structure evaluation system has a plurality of sensors, a signal processor, and an evaluator. The sensors detect an elastic wave generated from a structure. The signal processor acquires a reliability from a source of the elastic wave to the plurality of sensors by performing signal processing on the elastic wave detected by the plurality of sensors. The evaluator evaluates the soundness of the structure on the basis of the acquired reliability.

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Patent Owner(s)

  • KABUSHIKI KAISHA TOSHIBA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iida, Sanae Kanagawa, JP 3 11
Usui, Takashi Saitama, JP 220 1141

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