Voltage Rail Monitoring to Detect Electromigration
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United States of America Patent
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Nov 20, 2017
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Jan 28, 2016
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Abstract
A method detects electromigration in an electronic device. An integrated circuit, which is within an electronic device, is quiescented. An isolation power switch applies a test voltage from a field power source to a target voltage rail in the integrated circuit. An isolation power switch isolates the target voltage rail from the field power source. A voltage sensor coupled to the target voltage rail measures a field voltage decay rate for the target voltage rail. A voltage record comparator logic within the integrated circuit compares the field voltage decay rate to an initial voltage decay rate for the target voltage rail. In response to a difference between the field voltage decay rate and the initial voltage decay rate for the target voltage rail exceeding a predetermined limit, a signal is sent to an alarm associated with the electronic device.
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