METHOD OF DETERMINING THE DEFLECTION OF AN ELECTRON BEAM RESULTING FROM AN ELECTRIC FIELD AND/OR A MAGNETIC FIELD

Number of patents in Portfolio can not be more than 2000

United States of America Patent

SERIAL NO

15703557

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

Method of determining a local electric field and/or a local magnetic field in a sample and/or the dielectric constant of a material and/or the angle between the input and output surfaces of the sample, comprising the following steps:

    illumination of the sample by an electron beam in precession mode using an illumination device,generation of a diffraction pattern,determination of the offset of the disk corresponding to the transmitted beam due to the electric field and/or the magnetic field, by comparison of the diffraction pattern and a reference diffraction pattern,determination of a deflection angle of the transmitted beam,determination of the value of the local electric field and/or the local magnetic field of the sample and/or determination of the dielectric constant of materials and/or determination of the angle between the input and output surfaces of the sample.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES25 RUE LEBLANC BAT LE PONANT PARIS 75015

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
COOPER, David Grenoble, FR 94 1443
HAAS, Benedikt Grenoble, FR 1 1
ROUVIERE, Jean-Luc Meylan, FR 3 4

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation