COUNTING STACKED PLANAR SUBSTRATES
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United States of America Patent
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Apr 21, 2015
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Apr 21, 2015
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Abstract
Devices and methods for counting planar substrates stacked on a first plane are disclosed. Image capturing sensors are arranged collinearly in a manner substantially perpendicular to the first plane. The image capturing sensors are configured to capture images of portions of counting sides of the stacked planar substrates. The image capturing sensors are configured so that the images captured by every two consecutive image capturing sensors comprise an overlapping portion of the stacked planar substrates.
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