ABNORMAL WAVEFORM SENSING SYSTEM, ABNORMAL WAVEFORM SENSING METHOD, AND WAVEFORM ANALYSIS DEVICE

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20180260656A1
SERIAL NO

15903116

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

The present invention includes acquiring an event point which is part of a reference waveform and which satisfies a predetermined condition, and extracting a singular point being part of the reference waveform in a period to which the acquired event point belongs, and has a value that indicates predetermined change, acquiring, when part of a target waveform corresponds to the event point, the part as a correspondence event point, and detecting a correspondence singular point in the period of the target waveform to which the correspondence event point belongs and corresponding to the singular point of the reference waveform, calculating a dissimilarity degree between a correction waveform generated based on the above four points and the reference waveform and the target waveform newly acquired, determining whether the target waveform has abnormality based on the dissimilarity degree, and outputting abnormality information.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
HITACHI LTDJAPAN

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
OHKUBO, Keiko Tokyo, JP 4 54
SUZUKI, Toshiaki Tokyo, JP 254 5238

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation