SENSING SYSTEM, SENSING WAFER, AND PLASMA PROCESSING APPARATUS

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United States of America Patent

APP PUB NO 20180261481A1
SERIAL NO

15704711

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Abstract

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According to one embodiment, a sensing system includes a waveguide, an optical system, and a detector. The waveguide is configured to guide light in a wafer. The optical system is configured to cause the light guided by the waveguide to go out from a back side of the wafer. The detector is configured to detect a state inside or outside the wafer based on a detection result about the light caused to go out by the optical system.

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Patent Owner(s)

Patent OwnerAddress
TOSHIBA MEMORY CORPORATION1-1 SHIBAURA 1-CHOME MINATO-KU TOKYO 105-0023

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ETO, Hideo Yokkaichi, JP 34 443

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