MEASURING OPERATIONAL PARAMETERS AT THE GUIDED SURFACE WAVEGUIDE PROBE

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United States of America Patent

APP PUB NO 20180261902A1
SERIAL NO

15909632

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Disclosed is an exemplary guided surface waveguide probe. In one embodiment, the guided surface waveguide probe comprises a charge terminal elevated to a height above the lossy conducting medium; a support structure that supports the charge terminal; an internal coil that is supported within the support structure and is coupled to an excitation source; a conductive tube having a first end conductively coupled to the at least one section of internal coil, wherein a second end of the conductive tube extends vertically towards and is electrically coupled to the charge terminal; at least one sensor electrically coupled to the charge terminal or the internal coil, wherein the at least one sensor measures an operational parameter of the guided surface waveguide probe; and a non-conductive channel connected to the at least one sensor by which data associated with the operational parameter is communicated.

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Patent Owner(s)

Patent OwnerAddress
QUANTUM WAVE LLC414 CHURCH STREET SUITE 308 SANDPOINT ID 83864

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Corum, James F Morgantown, US 142 1671
Corum, Kenneth L Plymouth, US 125 1387
Lomax, Jerry A Katy, US 11 9
Lougheed,, JR Timothy J Midlothian, US 10 9

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