Force Measurement with Real-Time Baseline Determination
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United States of America Patent
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Issued Date -
Oct 18, 2018
app pub date -
Mar 6, 2018
filing date -
Mar 6, 2018
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Abstract
An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts.
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