Aliphatic UV cured polyurethane optical endpoint detection windows with high UV transparency for CMP polishing pads
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United States of America Patent
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Nov 5, 2019
Grant Date -
May 16, 2019
app pub date -
Nov 16, 2017
filing date -
Nov 16, 2017
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Abstract
The present invention provides chemical mechanical (CMP) polishing pads for polishing a substrate chosen from a semiconductor substrate comprising the CMP polishing pad and having one or more endpoint detection windows which is the cured product of a reaction mixture of a linear cycloaliphatic urethane macromonomer having two (meth)acrylate endgroups bound via cycloaliphatic dicarbamate esters to a polyether, polycarbonate or polyester chain having an average molecular weight of from 450 to 2,000, or an cycloaliphatic urethane oligomer thereof, and an aliphatic initiator, wherein the total isocyanate content in the urethane macromonomer ranges from 3.3 to 10 wt. %, and, further wherein, the composition comprises less than 5 wt. % of unreacted (meth)acrylate monomer and is substantially free of unreacted isocyanate. Regardless of their hardness or lack thereof, the endpoint detection windows provide excellent durability when wet.

First Claim
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC | 451 BELLEVUE ROAD NEWARK DE 19713 |
International Classification(s)
- C09K:MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED ....
- H01L:SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICE....
- C08G:MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN B....
- C09G:POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH; S....
- C08F:MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONL....
- C08L:COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- B24D:TOOLS FOR GRINDING, BUFFING, OR SHARPENING

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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Gadinski, Matthew R | Newark, US | 18 | 6 |
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