Measurement system, machining system, measurement method, and computer-readable recording medium
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United States of America Patent
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Sep 15, 2020
Grant Date -
May 30, 2019
app pub date -
Nov 28, 2018
filing date -
Nov 29, 2017
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A measurement system is for measuring positions of a plurality of subjects by using an ultrasonic testing sensor. The measurement system includes an ideal arcuate waveform creation unit configured to create, for each of the subjects, an ideal arcuate waveform of a measurement result of the ultrasonic testing sensor based on machining position information on the subject; a measurement arcuate waveform creation unit configured to create a measurement arcuate waveform based on the measurement result; a position estimation unit configured to collate the ideal arcuate waveform and the measurement arcuate waveform with each other to estimate a position of the subject from the measurement arcuate waveform determined to correspond to any ideal arcuate waveform; and an antiphase waveform addition unit configured to add, to the measurement arcuate waveform, a waveform in antiphase to the measurement arcuate waveform with which the position of the subject has been estimated.
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