Wide Band Gap Semiconductor Device and Method for Forming a Wide Band Gap Semiconductor Device

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United States of America Patent

APP PUB NO 20190311903A1
SERIAL NO

16374457

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Abstract

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A method for forming a wide band gap semiconductor device is provided. The method includes forming a gate insulation layer on a wide band gap semiconductor substrate and annealing the gate insulation layer using at least a first reactive gas species and a second reactive gas species, wherein the first reactive gas species differs from the second reactive gas species. The method can include forming a gate electrode on the gate insulation layer after annealing the gate insulation layer.

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Patent OwnerAddress
INFINEON TECHNOLOGIES AGCAMPBELL 1-15 NAUBIBERG GERMANY NEUBIBERG BAVARIA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aichinger, Thomas Faak am See, AT 38 191
Rescher, Gerald Bruckl, AT 2 1
Stadtmueller, Michael Villach, AT 19 48

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