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Abstract

With a conventional high-frequency measurement method, it is difficult to accurately grasp variation in high-frequency performance when a high-frequency signal is input to an amplifier. One aspect of a high-frequency measurement method according to the present invention includes generating a test signal (TS), which is a sine-wave signal having a predetermined frequency, in which a period (τ) during which the power level is at a first power level and a period (T-τ) during which the power level is at a second power level lower than the first power level are periodically repeated, inputting the test signal (TS) to a device under test (10) as an input signal, and measuring the difference between an output signal (OUT) of the device under test (10) and an ideal value of the output signal (OUT).

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First Claim