ANALYZING MICROTEXTURED REGIONS OF OPTICALLY ANISOTROPIC MATERIALS

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United States of America

SERIAL NO

16431161

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Abstract

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Images of samples that are illuminated with polarized light are captured. Azimuth and inclination data are extracted from the captured images. The azimuth and inclination data are used to quantify MTRs.

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Patent Owner(s)

Patent OwnerAddress
MRL MAT RESOURCES LLCNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Salem, Ayman A Beavercreek, US 6 10
Satko, Daniel P Centerville, US 5 8

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