FINE RATIO MEASURING DEVICE AND FINE RATIO MEASURING SYSTEM

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United States of America

SERIAL NO

16341524

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A fine ratio measuring device that measures the fine ratio of fines adhering to the surface of the material in the form of lumps includes: an illumination unit that illuminates the material in the form of lumps; an imaging unit that captures an image of the material in the form of lumps and produces image data; and an arithmetic unit including a computation unit that computes a characteristic quantity of the image data produced by the imaging unit and a conversion unit that converts the characteristic quantity computed by the computation unit to the fine ratio.

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Patent Owner(s)

Patent OwnerAddress
JFE STEEL CORPORATION2-3 UCHISAIWAI-CHO 2-CHOME CHIYODA-KU TOKYO 100-0011

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirata, Takehide Tokyo, JP 15 13
Nishino, Takahiro Tokyo, JP 3 10
Tsuboi, Toshiki Tokyo, JP 18 13
Tsuda, Kazuro Tokyo, JP 3 8
Yamahira, Naoshi Tokyo, JP 9 11

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