WAFER SURFACE TEST PREPROCESSING DEVICE AND WAFER SURFACE TEST APPARATUS HAVING THE SAME

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20200057105A1
SERIAL NO

16253466

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Abstract

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A wafer surface test preprocessing device includes a chamber; a supporting component disposed in the chamber; an atomizer connected to a lateral side of the chamber; a cooling component connected to a bottom of the chamber; and a lid disposed on a top of the chamber. With the wafer surface test preprocessing device having the cooling component to thereby dispense with a ventilation device and collect hydrofluoric acid residues in the chamber at the bottom of the chamber, thereby saving costs and time effectively.

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Patent Owner(s)

Patent OwnerAddress
CHIANG TE MINGNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHIANG, TE-MING HSINCHU CITY, TW 12 59

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