FILM FORMING METHOD AND FILM FORMING APPARATUS

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20200058504A1
SERIAL NO

16540347

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of selectively forming a silicon film on an upper portion of each of protruded portions formed on a substrate, which includes: supplying a first silicon-containing gas to the substrate and forming a first silicon film so that a film thickness of the first silicon film becomes thicker in the upper portion rather than in a lower portion of a sidewall of each protruded portion; subsequently, supplying an etching gas to the substrate and removing the first silicon film on the sidewall of each protruded portion while leaving the first silicon film on an upper surface of each protruded portion; and subsequently, supplying a second silicon-containing gas to the substrate and forming a second silicon film so that a film thickness of the second silicon film becomes thicker in the upper portion rather than in the lower portion of a sidewall of each protruded portion.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO 107-6325

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HAYASHI, Hiroyuki Nirasaki City, JP 233 2128
KANEMURA, Rui Nirasaki City, JP 8 2

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