Chemical Mechanical Planarization For Tungsten-Containing Substrates

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20200079976A1
SERIAL NO

16560713

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

Chemical mechanical polishing (CMP) compositions, systems and methods of using the compositions for polishing tungsten or tungsten-containing substrates. The compositions comprise nano-sized abrasive; metal compound coated organic polymer particles as solid state catalyst; oxidizer; tungsten corrosion inhibitor; and a water based liquid carrier.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
VERSUM MATERIALS US LLC8555 SOUTH RIVER PARKWAY PATENT DEPT TEMPE AS 85284

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Schlueter, James Allen Phoenix, US 21 99
Schwartz, Jo-Ann T Kennett Square, US 10 340
Shi, Xiaobo Chandler, US 79 342
Zhou, Hongjun Chandler, US 74 92

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation