Systems and methods for measuring radiated thermal energy during an additive manufacturing operation

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United States of America Patent

PATENT NO 11390035
APP PUB NO 20200101671A1
SERIAL NO

16574388

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.

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Patent Owner(s)

  • SIGMA LABS, INC.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beckett, Darren Corrales, US 15 43
Castro, Alberto M Santa Fe, US 11 42
Cola, Mark J Santa Fe, US 38 556
Dave, Vivek R Concord, US 39 408
Jacquemetton, Lars Santa Fe, US 21 129
Madigan, R Bruce Butte, US 31 445
Wikle, Glenn Santa Fe, US 14 165

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