PRODUCT IMBALANCE ANALYSIS METHODS AND RELATED SYSTEMS AND APPARATUSES
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United States of America Patent
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Jun 9, 2022
app pub date -
Feb 24, 2022
filing date -
Feb 24, 2022
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Abstract
In some embodiments, a system uses a two-dimensional polar plot to analyze imbalance of components. On the two-dimensional polar plot imbalance magnitude and orientation are depicted relative to a reference. Some embodiments use the two-dimensional polar plot to assess measurement error for measurement devices and components. Some embodiments use the two-dimensional polar plot to determine patterns associated with processing operations to identify sources of imbalance from the manufacturing process. Some embodiments use the two-dimensional polar plot to determine correlations between processing operations to identify sources of imbalance.
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