CMP SLURRY COMPOSITION FOR POLISHING TUNGSTEN PATTERN WAFER AND METHOD OF POLISHING TUNGSTEN PATTERN WAFER USING THE SAME

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United States of America Patent

APP PUB NO 20220298381A1
SERIAL NO

17695006

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Abstract

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A CMP slurry composition for polishing a tungsten pattern wafer and a method of polishing a tungsten pattern wafer using the same. The CMP composition includes: a solvent; an abrasive agent; and a dendritic poly(amidoamine) containing a terminal amino group.

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Patent Owner(s)

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SAMSUNG SDI CO LTDYONGIN-SI GYEONGGI-DO 17084

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
LEE, Hyun Woo Suwon-si, KR 557 7890
LEE, Ji Ho Suwon-si, KR 25 130
LEE, Jong Won Suwon-si, KR 190 1526
SIM, Soo Yeon Suwon-si, KR 5 0

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