SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS

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United States of America Patent

APP PUB NO 20220356584A1
SERIAL NO

17736048

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In one exemplary embodiment, a substrate processing apparatus is provided. The substrate processing apparatus comprises: a chamber; a substrate support disposed in the chamber; a gas supply disposed in the chamber and connected to a supply source of reaction gas containing HF gas and CxHyFz gas (where x and z are integers equal to or greater than 1 and y is an integer equal to or greater than 0); and a plasma-generator configured to form a plasma from the reaction gas supplied to the chamber from the gas supply, wherein at least a portion of the chamber exposed to the plasma is made of a conductive silicon-containing material.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO 107-6325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
TOMURA, Maju Miyagi, JP 91 391

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