Atomic-force Microscopy for Identification of Surfaces
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United States of America Patent
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Jan 11, 2024
app pub date -
Sep 21, 2023
filing date -
Nov 7, 2018
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Abstract
A method comprises using an atomic-force microscope, acquiring a set of images associated with surfaces, and, using a machine-learning algorithm applied to the images, classifying the surfaces. As a particular example, the classification can be done in a way that relies on surface parameters derived from the images rather than using the images directly.
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