Inertial Measurement Device And Method For Manufacturing Inertial Measurement Device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20240035823A1
SERIAL NO

18360316

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An inertial measurement device includes: a substrate having a joining area; a cap; a sensor device accommodated in a resin package and disposed in a mounting area on the substrate in an internal space between the substrate and the cap; and a sealing material and a joining material configured to join the cap to the substrate in the joining area of the substrate. The joining material surrounds the mounting area and has a communication hole for communication between the internal space and the outside, and the sealing material closes the communication hole.

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Patent Owner(s)

Patent OwnerAddress
SEIKO EPSON CORPORATIONTOKYO 160-8801

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
OGISO, Hiroyuki Ina, JP 26 176
WATANABE, Toru Matsumoto, JP 214 1840

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