Importance

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Abstract

The present disclosure provides a test system for testing a device under test, the test system comprising at least one measurement application antenna, and a Reconfigurable Intelligent Surface, RIS, reflector configured to reflect an incoming signal that impinges on the RIS reflector with a predefined impinging angle as reflected signal with a predefined outgoing angle, and a measurement application device coupled to the measurement application antenna and configured to qualify beamforming characteristics of the device under test based on RF signals exchanged between the measurement application device and the device under test via the at least one measurement application antenna and the RIS reflector. Further, the present disclosure provides a respective test method.

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First Claim