RADIATION MEASUREMENT DEVICES
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United States of America Patent
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Issued Date -
Apr 25, 2024
app pub date -
Dec 27, 2023
filing date -
Dec 27, 2023
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Abstract
A radiation measurement device may be provided. The radiation measurement device may comprise a scattering component and a first detector. The scattering component may be located between a radiation source of an imaging device and the first detector, and configured to scatter first radiation rays emitted by the radiation source into scattering rays. The first detector may be configured to collect first measurement data by detecting at least a portion of the scattering rays, the first measurement data reflecting an operation status of the radiation source.
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