MEMORY DEVICE WITH FAILED MAIN BANK REPAIR USING REDUNDANT BANK

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20240152435A1
SERIAL NO

18413583

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

In certain aspects, a memory device includes an array of memory cells, an input/output (I/O) circuit, and I/O control logic coupled to the I/O circuit. The array of memory cells includes P groups of banks. Each group of banks includes N main banks and M redundant banks, where each of P, N and M is a positive integer, and N is greater than M The I/O circuit is coupled to the P groups of banks and configured to direct P×N pieces of data to or from P×N working banks, respectively. One of the M redundant banks is coupled with at least two main banks of the N main banks through the I/O circuit. The I/O control logic is configured to in responding to K main banks of the P groups of banks failed, determine the P×N working banks including K redundant banks of P×M redundant banks, where K is a positive integer not greater than P, and control the I/O circuit to direct P×N pieces of data to or from the P×N working banks, respectively.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
YANGTZE MEMORY TECHNOLOGIES CO LTD18 GAOXIN 4TH ROAD EAST LAKE HIGH-TECH DEVELOPMENT ZONE WUHAN 430074

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
TANG, Qiang Wuhan, CN 190 774

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation