CHARACTERISTIC VALUE CORRECTION DEVICE, CHARACTERISTIC VALUE CALCULATION DEVICE, INSPECTION DEVICE INCLUDING THE SAME, CHARACTERISTIC VALUE CORRECTION METHOD, LIGHT-EMITTING DEVICE, AND CHARACTERISTIC VALUE CORRECTION PROGRAM
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United States of America Patent
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Issued Date -
Jun 20, 2024
app pub date -
Dec 11, 2023
filing date -
Dec 11, 2023
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Abstract
A characteristic value correction device includes a waveform acquiring unit, an area calculating unit, a time calculating unit, and a correction coefficient calculating unit. The waveform acquiring unit is configured to acquire a waveform indicating a relationship between an elapsed time and a first current value obtained when the pulse current is applied to a light-emitting device. The area calculating unit is configured to calculate a first area of an entire waveform and a second area of a rectangular wave portion. The time calculating unit is configured to calculate a first time between an application start time and an application end time of the pulse current and a second time corresponding to the second area. The correction coefficient calculating unit is configured to obtain a correction coefficient based on a ratio between the first area and the second area and a ratio between the first time and the second time.
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