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Abstract

A method and a system for initial self-healing type classification of metallized film capacitors, which relate to the technical field of high-voltage capacitors. The method comprises: applying voltages at different voltage ramp rates to metallized film capacitors to be tested, and determining a voltage bearing range of the metallized film capacitors; determining, according to a corresponding voltage of the metallized film capacitors when initial self-healing occurs and a residual voltage after the initial self-healing occurs, corresponding initial self-healing energy of metallized film capacitors when the initial self-healing occurs; establishing an initial self-healing voltage-energy database according to an initial self-healing voltage of the samples when the initial self-healing occurs and the corresponding initial self-healing energy when the initial self-healing occurs; and classifying the metallized film capacitors by combining an initial self-healing recovery condition and the subsequent service life and performance data of the metallized film capacitors.

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