DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING METHOD

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United States of America Patent

APP PUB NO 20240280606A1
SERIAL NO

18567158

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Between a nitrogen-vacancy center and a support portion, a cut-off portion is provided that cuts off the nitrogen-vacancy center from the support portion.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTDTOKYO JAPAN TOKYO METROPOLIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KOGUCHI, Masanari Tokyo, JP 30 665

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