Importance

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Abstract

A semiconductor device includes: a test signal generation circuit that modulates a test signal to generate fifth and sixth modulated signals; a first amplification circuit that outputs a third and fourth amplified signals that are obtained by amplifying the fifth and sixth modulated signal to the first and second output terminal; a second amplification circuit that outputs seventh and eighth amplified signal s that are obtained by amplifying the fifth and sixth modulated signals to the third and fourth output terminals; a first peak frequency detection circuit that measures a potential difference between the first and second output terminals to detect a first peak frequency; a second peak frequency detection circuit that measures a potential difference between the third and fourth output terminals to detect a second peak frequency; and a determination circuit that determines whether or not a difference between the first and second peak frequency is included in a predetermined reference frequency difference range.

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First Claim