METHOD FOR REMOVING LAMINATED MATERIAL ON SURFACE OF INTERMEDIATELY DISCHARGED SILICON WAFER

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250083283A1
SERIAL NO

18705010

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

Provided is a method for removing a laminated material on a surface of a silicon wafer capable of considerably efficiently removing a laminated material on a surface of a silicon wafer at a low cost with a simple apparatus without a negative effect on environment or a serious damage on the silicon wafer as a substrate. A blasting process was performed by spraying boron carbide (B4C) having a particle size of #220 as an abrasive on a laminate surface of a laminated material of an intermediately discharged silicon wafer using a blasting machine (dry type that sprays a dry abrasive, and a gravity type that sprays the abrasive fallen from a tank of the abrasive due to gravity on a compressed air) under spray conditions of a spray distance=120 mm and a spray pressure=0.2 MPa for five seconds.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
KEITECH CO LTD14-1 TOYOBASAKAE TOYOYAMA-CHO NISHIKASUGAI-GUN AICHI 4800202
NANOLUB CO LTD17-13 MARUNOUCHI 2-CHOME NAKA-KU NAGOYA-SHI AICHI 4600002

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
SUN, Yongsheng Nagoya-shi, Aichi, JP 10 4

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation